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AL-Y3000 X-ray diffractometer

AL Series diffractometer is designed for materials research and industrial products analysis. It is the perfect combination of conventional analysis with special-purpose measurement products.

 
 

● The perfect combination of hardware and software systems meets the needs of academics and researchers in different application areas.
● High precision diffraction angle measurement system obtains more accurate results
● High stability of the X-ray generator control system gets more stable repeatability precision
● Programmable operation, integrated structure design, easy operation, elegant outlook.

DX Series diffractometer is designed for materials research and industrial products analysis. It is the perfect combination of conventional analysis with special-purpose measurement products.
● The perfect combination of hardware and software systems meets the needs of academics and researchers in different application areas.
● High precision diffraction angle measurement system obtains more accurate results
● High stability of the X-ray generator control system gets more stable repeatability precision
● Programmable operation, integrated structure design, easy operation, elegant outlook.
 

X-ray diffractometer analyzes natural or synthetic inorganic or organic material, widely used in the field of clay minerals, cement, building materials, environmental dust, chemical products, pharmaceuticals, asbestos, rock, polymer research.
● θ-θ geometry-based optical design is easy for sample preparation and the installation of various accessories
● The application of metal ceramic X-ray tube greatly enhanced diffractometer's operating power
● Closed proportional counter is durable and maintenance-free
● Silicon drift detector, with superior angular resolution and energy resolution, enables measurement speed increased by more than 3 times
● Varies diffractometer accessories meet different analytical purposes needs
● Modular design, known as plug-and-play components, allows operators to accurately use diffractometer corresponding attachments, without needing calculating optical system.

Data measurement function
     ● θs-θd conventional symmetric measurements
     ● Qualitative and quantitative analysis
     ● Samples crystal structure analysis
     ● Crystal's crystallization evaluation
     ● Evaluation on Lattice size and lattice stress

θs-θd asymmetry measurement (grazing measurement)
     ● Qualitative analysis and structural analysis on film / powder sample
     ● Precise analysis on lattice constants
     ● Evaluation on residual stress / orientation
     ● Film/density measurement

0mg swing measurement
Precise evaluation on sample's crystallization status

Different measuring functions are all designed for studying material's structure, all results getting from every measurement methods have their corresponding processing software to meet analysis requirements.

Optical system converter
Sola slit structure can be changed without needing to disassemble Sola slit body. Due to this character, the instrument, without needing readjust, can achieve the converter between focus optical system and horizontal optical system.

The previous focusing method optical system and the parallel beam method optical system need to respectively set with a bend monochrometer and a flat crystal monochromator, and the optical systems converter needing readjust optical systems. The adoption of this system can easily getting optical systems converter just by rotating the nomochrometer crystal to 90° and changing slit structure.

Data processing software includes the following features
Basic data processing functions (peak searching, smoothing, background subtraction, peak shape fitting, peak shape enlargement, spectra comparison, Kα1, α2 stripping, diffraction lines indexing );
  ● No-standard sample's rapid quantitative analysis
  ● Crystal size measurement
  ● Crystal structure analysis (crystal cell parameters measurement and refinement)

 


  

● Macroscopic stress measurements and microscopic stress;
● Two-dimensional and three-dimensional display of multiple drawing;
● Diffraction peak drawings' cluster analysis;
● Diffraction data's half-peak width calibration curve;
● Deviation data's angular deviation correction curve;
● Rietveld based conventional quantitative analysis;
● Use ICDD database or user database to perform phase qualitative analysis;
● Use ICDD database or ICSD database to perform quantitative analysis;

Besides the basic functions, the DX series diffractometers can be quickly set with a variety of accessories, with  superior analytical capabilities
High-precision machining greatly enhanced installation location's reproducibility, achieving  plug and play. Special aim measurement can be achieved by just selecting corresponding accessories in software, not needing calibrating optical system.

Multi-sample holder
With the deepening of materials research, more and more plates, massive material and the substrate film also require analysis by X-ray diffractometer. Multifunction sample holder can be installed on the goniometer to perform texture, macro stress and film surface structure test. Each test function has a corresponding calculation software.
● Grind rolled plate (aluminum, iron, copper, etc.) texture measurement and evaluation
● Residual stress measurement of metals, ceramics and other materials
● The film sample crystal priority faceted evaluation
● Orientation measurements of macromolecular compounds
● Metals, the multilayer film on the non-metallic substrate, an oxide film, a nitride film analysis

  


    the performance of the material, give full play to the potential of the material properties, is one of the important work of the materials science. Though the detection material texture has many methods, the most widely used is still X-ray diffraction techniques.
The multifunction sample holder is used for sample texture measurements. The pole figures, inverse pole figures, ODF Figurewere can seperately drawn after calculation by software.